LU Shi-jin

Publications

Citations

H-Index

2015

Active since

Affiliations

Beijing Microelectronics Technology Institute(Current)

LU Shi-jin is an author at Beijing Microelectronics Technology Institute specializing in computer architecture, electrical engineering, and hardware security.

Top concepts

EngineeringVlsi DesignMicroelectronicsHardware SecurityComputer EngineeringSingle Event EffectsComputer ArchitectureElectrical EngineeringReliabilityCircuit Design

Publications per year

2015–2017

Publications

Design of a novel 12T radiation hardened memory cell tolerant to single event upsets (SEU)

Chunyan Hu, Suge Yue, LU Shi-jin · 2017 · 19 citations

Single Event Upset, Engineering, Vlsi Design +21

Single event soft error in advanced integrated circuit

Yuanfu Zhao, Suge Yue, Xinyuan Zhao et al. · Journal of Semiconductors · 2015 · 13 citations

Single Event Upset, Engineering, Vlsi Design +17

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