Suge Yue

SEU and SET of 65 Bulk CMOS Flip-flops and Their Implications for RHBD

Yuanfu Zhao, Liang Wang, Suge Yue et al. · IEEE Transactions on Nuclear Science · 2015 · 24 citations

Single Event Upset, Radiation Hardening, Engineering +19

Modeling and simulation of single-event effect in CMOS circuit

Suge Yue, Xiaolin Zhang, Yuanfu Zhao et al. · Journal of Semiconductors · 2015 · 19 citations

Engineering, Vlsi Design, Computer Architecture +16

Design of a novel 12T radiation hardened memory cell tolerant to single event upsets (SEU)

Chunyan Hu, Suge Yue, LU Shi-jin · 2017 · 19 citations

Single Event Upset, Engineering, Vlsi Design +21

A low-voltage CMOS low-dropout regulator with novel capacitor-multiplier frequency compensation

Zushu Yan, Liang-Guo Shen, Yuanfu Zhao et al. · 2008 · 14 citations

Low-power Electronics, Mixed-signal Integrated Circuit, Dropout Voltage +2

Single event soft error in advanced integrated circuit

Yuanfu Zhao, Suge Yue, Xinyuan Zhao et al. · Journal of Semiconductors · 2015 · 13 citations

Single Event Upset, Engineering, Vlsi Design +17