Peter J. M. G. Vullings

Quantification issues of trace metal contaminants on silicon wafers by means of TOF-SIMS, ICP-MS, and TXRF

P. Rostam-Khani, M. Hopstaken, Peter J. M. G. Vullings et al. · Applied Surface Science · 2004 · 21 citations

Environmental Chemistry, Chemical Engineering, Silicon Wafers +10

Fast semiquantitative survey analysis of solids by laser ablation inductively coupled plasma mass spectrometry

Peter van de Weijer, Wilhelmina L. M. Baeten, Mirjan H. J. Bekkers et al. · Journal of Analytical Atomic Spectrometry · 1992 · 19 citations

Engineering, Biological Mass Spectrometry, Laser Applications +20

Quantitative analysis of surface contaminants on silicon wafers by means of TOF-SIMS

P. Rostam-Khani, J. Philipsen, E. Jansen et al. · Applied Surface Science · 2006 · 12 citations

Hazardous Waste, Electrical Engineering, Chemical Engineering +12

Determination of uranium and thorium in aluminium with flow injection and laser ablation inductively coupled plasma mass spectrometry

Peter van de Weijer, Peter J. M. G. Vullings, Wilhelmina L. M. Baeten et al. · Journal of Analytical Atomic Spectrometry · 1991 · 10 citations