Y. Y. Gomeniuk

An investigation of capacitance-voltage hysteresis in metal/high-<i>k</i>/In0.53Ga0.47As metal-oxide-semiconductor capacitors

Jun Lin, Y. Y. Gomeniuk, Scott Monaghan et al. · Journal of Applied Physics · 2013 · 65 citations

Materials Science, Electrical Engineering, Charge Trapping +12

Probing Interface Defects in Top-Gated MoS₂ Transistors with Impedance Spectroscopy

Peng Zhao, Angelica Azcatl, Y. Y. Gomeniuk et al. · ACS Applied Materials & Interfaces · 2017 · 45 citations

Observation of peripheral charge induced low frequency capacitance-voltage behaviour in metal-oxide-semiconductor capacitors on Si and GaAs substrates

Eileen O’Connor, K. Cherkaoui, Scott Monaghan et al. · Journal of Applied Physics · 2012 · 27 citations · Full text

Engineering, Charge Transport, Mos Capacitors +18

Charge trapping in ultrathin Gd2O3 high-k dielectric

A. N. Nazarov, Y. V. Gomeniuk, Y. Y. Gomeniuk · Microelectronic Engineering · 2007 · 13 citations

Engineering, Applied Physics, Condensed Matter Physics +3

Physical, chemical and electrical characterisation of the diffusion of copper in silicon dioxide and prevention via a CuAl alloy barrier layer system

Conor Byrne, Barry Brennan, Ross Lundy et al. · Materials Science in Semiconductor Processing · 2017 · 12 citations

Materials Engineering, Materials Science, Electrical Engineering +7