A. Hesse - Concepedia

Author

A. Hesse

Johannes Kepler University of Linz

Also Known As

A Hesse, A. Hesse, Anke Hesse, Hesse, Anke

Publications

294

Citations

H-Index

Concepts

All Affiliations

Johannes Kepler University of Linz European Synchrotron Radiation Facility Max Planck Institute for Solid State Research

About

A. Hesse is an author at Johannes Kepler University of Linz specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	248
2	Applied Physics	7	7	248
3	Natural Sciences	1	1	28
4	Chemistry	1	1	28
5	Electrical Engineering	1	1	18

A. Hesse

Publications

258

Citations

H-Index

Page 1

	Year	Citations
Effect of overgrowth on shape, composition, and strain of SiGe islands on Si(001) A. Hesse, J. Stangl, V. Holý, Physical review. B, Condensed matter EngineeringBuried IslandsSilicon On InsulatorVertical Composition GradientSilicene	2002	75
Influence of growth temperature on interdiffusion in uncapped SiGe-islands on Si(001) determined by anomalous x-ray diffraction and reciprocal space mapping Tobias U. Schülli, M. Stoffel, A. Hesse, Physical Review B Island SizeEngineeringCrystal Growth TechnologySilicon On InsulatorUncapped Sige-islands	2005	59
Effect of overgrowth temperature on shape, strain, and composition of buried Ge islands deduced from x-ray diffraction J. Stangl, A. Hesse, V. Holý, Applied Physics Letters Materials ScienceBuried Ge IslandsEngineeringSurface ScienceApplied Physics	2003	35
Intraband absorption and photocurrent spectroscopy of self-assembled <i>p</i>-type Si/SiGe quantum dots Thomas Fromherz, W. Mac, A. Hesse, Applied Physics Letters Absorption LineOptical MaterialsQuantum PhotonicsEngineeringChemistry	2002	28
Investigation of shape, strain, and interdiffusion in InGaAs quantum rings using grazing incidence x-ray diffraction Michael Sztucki, Till H. Metzger, Virginie Chamard, Journal of Applied Physics EngineeringElectron DiffractionSemiconductor NanostructuresSemiconductorsNanoscale Science	2006	19
Strain in buried self-assembled SiGe wires studied by grazing-incidence x-ray diffraction V. Holý, A. Hesse, J. Stangl, Physical review. B, Condensed matter Materials ScienceElectrical EngineeringDiffraction PatternEngineeringPhysics	2002	18
Shape and composition change of Ge dots due to Si capping O. Kirfel, E. Müller, Detlev Grützmacher, Applied Surface Science Materials ScienceMaterials EngineeringEngineeringPhysicsSurface Science	2003	14
Silicon nitride waveguide coupled 67+ GHz Ge photodiode for non-SOI PIC and ePIC platforms Stefan Lischke, D. Knoll, Christian Mai,	2019	10

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