Lionel Assmann

Study of the Mo thin films and Mo/CIGS interface properties

Lionel Assmann, J.C. Bérnède, A. Drici et al. · Applied Surface Science · 2004 · 145 citations

Materials Engineering, Materials Science, Ii-vi Semiconductor +8

X-ray photoelectron spectroscopy study of MoTe2 single crystals and thin films

J.C. Bérnède, C. Amory, Lionel Assmann et al. · Applied Surface Science · 2003 · 70 citations

Materials Science, Engineering, Oxide Electronics +7

Evolution of the band structure of β-In2S3−3xO3x buffer layer with its oxygen content

Nicolas Barreau, Sylvain Marsillac, J.C. Bérnède et al. · Journal of Applied Physics · 2003 · 66 citations

Materials Science, β-In2s3−3xo3x Buffer Layer, Engineering +15

Band alignment at β-In2S3/TCO interface

J.C. Bérnède, Nicolas Barreau, Sylvain Marsillac et al. · Applied Surface Science · 2002 · 40 citations

Ii-vi Semiconductor, Engineering, Physics +4

Impact of Cu-rich growth on the CuIn1−xGaxSe2 surface morphology and related solar cells behaviour

Nicolas Barreau, Jonas Lähnemann, F. Couzinié-Devy et al. · Solar Energy Materials and Solar Cells · 2009 · 30 citations

Materials Science, Cu-rich Growth, Engineering +5