C. R. Wie

Statistics

Publications

Citations

1.4K

H-Index

Active since

1984

Affiliations

University at Buffalo, State University of New York(Current)

California Institute of Technology

University of Rochester

Samsung (South Korea)

Wright-Patterson Air Force Base

C. R. Wie is an author at University at Buffalo, State University of New York specializing in materials science, semiconductor materials, and semiconductor physics.

Publications per year

1984–2010

Publications

Dynamical x-ray diffraction from nonuniform crystalline films: Application to x-ray rocking curve analysis

C. R. Wie, T.A. Tombrello, T. Vreeland · Journal of Applied Physics · 1986 · 219 citations

Natural Sciences, Materials Engineering, Materials Science +17

Use of a valved, solid phosphorus source for the growth of Ga0.5In0.5P and Al0.5In0.5P by molecular beam epitaxy

G. W. Wicks, Maximilian Koch, J. A. Varriano et al. · Applied Physics Letters · 1991 · 82 citations

Natural Sciences, Materials Engineering, Materials Science +13

Phonon shifts in ion bombarded GaAs: Raman measurements

Gerald Burns, F. H. Dacol, C. R. Wie et al. · Solid State Communications · 1987 · 72 citations

Natural Sciences, Electrical Engineering, Physics +14

High resolution x-ray diffraction characterization of semiconductor structures

C. R. Wie · Materials Science and Engineering R Reports · 1994 · 66 citations

Natural Sciences, Materials Science, Physics +14

Relaxation and rocking-curve broadening of strained (Ga,In)As single layers on (001) GaAs

C. R. Wie · Journal of Applied Physics · 1989 · 54 citations

Natural Sciences, Materials Engineering, Materials Science +17

1–5 of 45