Concepedia

C. R. Wie

CR

Statistics

Publications

45

Citations

1.4K

H-Index

22

Active since

1984

Affiliations

University at Buffalo, State University of New York(Current)

California Institute of Technology

University of Rochester

Samsung (South Korea)

Wright-Patterson Air Force Base

C. R. Wie is an author at University at Buffalo, State University of New York specializing in applied physics, engineering, and physics.

Top concepts

EngineeringApplied PhysicsElectrical EngineeringPhysicsMicroelectronicsMaterial ScienceSemiconductorsOptoelectronicsCrystalline DefectsCondensed Matter Physics

Publications per year

1984–2010

45

Publications

45

Dynamical x-ray diffraction from nonuniform crystalline films: Application to x-ray rocking curve analysis

C. R. Wie, T.A. Tombrello, T. Vreeland · Journal of Applied Physics · 1986 · 219 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +23

Use of a valved, solid phosphorus source for the growth of Ga0.5In0.5P and Al0.5In0.5P by molecular beam epitaxy

G. W. Wicks, Maximilian Koch, J. A. Varriano et al. · Applied Physics Letters · 1991 · 82 citations

Materials Science, Materials Engineering, Solid Phosphorus +12

Phonon shifts in ion bombarded GaAs: Raman measurements

Gerald Burns, F. H. Dacol, C. R. Wie et al. · Solid State Communications · 1987 · 72 citations

Applied Physics, Phonon Shifts, Phonon +1

High resolution x-ray diffraction characterization of semiconductor structures

C. R. Wie · Materials Science and Engineering R Reports · 1994 · 66 citations

Semiconductors, Materials Science, Engineering +6

Relaxation and rocking-curve broadening of strained (Ga,In)As single layers on (001) GaAs

C. R. Wie · Journal of Applied Physics · 1989 · 54 citations

Semiconductors, Wide-bandgap Semiconductor, Semiconductor Technology +14

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