J. Pivot

Analysis of evaporated silicon oxide films by means of (d, p) nuclear reactions and infrared spectrophotometry

A. Cachard, J.A. Roger, J. Pivot et al. · physica status solidi (a) · 1971 · 46 citations

Engineering, Solid-state Chemistry, Chemistry +20

Direct evidence of metal electrode diffusion into the dielectric of AlSiOAl capacitors in high electric field

J. Pivot, M. Boudeulle, A. Cachard et al. · physica status solidi (a) · 1970 · 24 citations

Mechanical properties of SiOx thin films

J. Pivot · Thin Solid Films · 1982 · 17 citations

Materials Science, Engineering, Mechanical Properties +4

Nitrogen implantation in titanium: RBS, THEED and TEM analysis

J-P Gauthier, Damien Fleche, J. Pivot et al. · Vacuum · 1984 · 14 citations

Materials Engineering, Materials Science, Ion Implantation +5

RBS, infrared and diffraction compared analysis of SiC synthesis in C implanted silicon

P. Durupt, B. Canut, Jean‐Pierre Gauthier et al. · Materials Research Bulletin · 1980 · 13 citations

Materials Science, Materials Engineering, Engineering +5