Statistics
Publications
1
Citations
13
H-Index
1
Active since
2019
Affiliations
Jan-Henrik Quast is an author at Federal Institute For Materials Research and Testing specializing in optical thin films, materials engineering, and semiconductor metrology.
Publications per year
2019–2019
1
1
Thin-film metrology of tilted and curved surfaces by imaging Mueller-matrix ellipsometry
Matthias Duwe, Jan-Henrik Quast, Stefan Schneider et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2019 · 13 citations
Natural Sciences, Materials Engineering, Materials Science +16
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