Quandou Wang - Concepedia

Author

Quandou Wang

National Institute of Standards and Technology

Also Known As

Quandou Wang

Publications

177

Citations

H-Index

Concepts

All Affiliations

National Institute of Standards and Technology

About

Quandou Wang is an author at National Institute of Standards and Technology specializing in engineering, interferometry, and calibration.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	5	5	104
2	Natural Sciences	2	2	53
3	Applied Physics	2	2	36
4	Materials Science	2	2	36
5	Education	1	1	15

Quandou Wang

Publications

126

Citations

H-Index

Page 1

	Year	Citations
A simple ball averager for reference sphere calibrations Ulf Griesmann, Quandou Wang, Johannes A. Soons, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementInterferometryComputer-aided DesignBall Averaging	2005	42
Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers Jungjae Park, Lingfeng Chen, Quandou Wang, Optics Express EngineeringOptical TestingInterferometryOptical CharacterizationSilicon On Insulator	2012	25
Measuring the phase transfer function of a phase-shifting interferometer Jiyoung Chu, Quandou Wang, John P. Lehan, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementCalibrationOptical PropertiesMoth Antennae	2008	15
Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor Daniel R. Neal, Paul Pulaski, Thomas D. Raymond, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE	2003	12
Manufacture and Metrology of 300 mm Silicon Wafers with Ultra-Low Thickness Variation Ulf Griesmann, Quandou Wang, Marc Tricard, AIP conference proceedings Wafer Thickness MetrologyEngineeringMicromanufacturingUltra-low Thickness VariationIntegrated Circuits	2007	11
Uncertainties in aspheric profile measurements with the geometry measuring machine at NIST Ulf Griesmann, Nadia Machkour, Johannes A. Soons, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMeasurementInterferometryUncertainty ParameterGeometry Measuring Machine	2005	11
Deformation-free form error measurement of thin, plane-parallel optics floated on a heavy liquid Jiyoung Chu, Ulf Griesmann, Quandou Wang, Applied Optics	2010	10

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