Concepedia

Quandou Wang

QW

7

Publications

126

Citations

7

H-Index

2003

Active since

Affiliations

National Institute of Standards and Technology(Current)

Quandou Wang is an author at National Institute of Standards and Technology specializing in engineering, interferometry, and calibration.

Top concepts

EngineeringInterferometryCalibrationMeasurementInstrumentationGeodesyTime MetrologyApplied PhysicsMaterial ScienceMicrofabrication

Publications per year

2003–2012

7

Publications

7

A simple ball averager for reference sphere calibrations

Ulf Griesmann, Quandou Wang, Johannes A. Soons et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 42 citations

Engineering, Measurement, Interferometry +20

Modified Roberts-Langenbeck test for measuring thickness and refractive index variation of silicon wafers

Jungjae Park, Lingfeng Chen, Quandou Wang et al. · Optics Express · 2012 · 25 citations · Full text

Engineering, Optical Testing, Interferometry +18

Measuring the phase transfer function of a phase-shifting interferometer

Jiyoung Chu, Quandou Wang, John P. Lehan et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2008 · 15 citations

Engineering, Measurement, Calibration +12

Testing highly aberrated large optics with a Shack-Hartmann wavefront sensor

Daniel R. Neal, Paul Pulaski, Thomas D. Raymond et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2003 · 12 citations

Manufacture and Metrology of 300 mm Silicon Wafers with Ultra-Low Thickness Variation

Ulf Griesmann, Quandou Wang, Marc Tricard et al. · AIP conference proceedings · 2007 · 11 citations · Full text

Wafer Thickness Metrology, Engineering, Micromanufacturing +22

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