C. J. Blomfield

A study of HMDSO/O2 plasma deposits using a high-sensitivity and -energy resolution XPS instrument: curve fitting of the Si 2p core level

Morgan R. Alexander, Robert D. Short, Frank R. Jones et al. · Applied Surface Science · 1999 · 338 citations

Natural Sciences, Materials Science, Physics +10

The influence of the yttrium content on the structure and properties of Ti1−x−y−zAlxCryYzN PVD hard coatings

D.B. Lewis, L.A. Donohue, M. I. Lembke et al. · Surface and Coatings Technology · 1999 · 68 citations

Natural Sciences, Materials Engineering, Materials Science +14

Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources

Alexander G. Shard, Jonathan D. P. Counsell, David J. H. Cant et al. · Surface and Interface Analysis · 2019 · 47 citations

Natural Sciences, Materials Engineering, Materials Science +13

The use of high-resolution XPS and ToF-SIMS to investigate segregation phenomena of minor components of a model coil coating formulation

Stuart R. Leadley, John F. Watts, C. J. Blomfield et al. · Surface and Interface Analysis · 1998 · 31 citations

Natural Sciences, Materials Engineering, Materials Science +17

Spatially resolved X-ray photoelectron spectroscopy

C. J. Blomfield · Journal of Electron Spectroscopy and Related Phenomena · 2004 · 26 citations

Natural Sciences, Materials Science, Physics +9