David J. H. Cant

Surface Properties of Nanocrystalline PbS Films Deposited at the Water–Oil Interface: A Study of Atmospheric Aging

David J. H. Cant, Karen L. Syres, Patrick J. B. Lunt et al. · Langmuir · 2015 · 81 citations · Full text

Inelastic background modelling applied to hard X-ray photoelectron spectroscopy of deeply buried layers: A comparison of synchrotron and lab-based (9.25 keV) measurements

Ben F. Spencer, Suresh Maniyarasu, Benjamen P. Reed et al. · Applied Surface Science · 2020 · 55 citations · Full text

X-ray Spectroscopy, Engineering, Photon Energy +19

Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources

Alexander G. Shard, Jonathan D. P. Counsell, David J. H. Cant et al. · Surface and Interface Analysis · 2019 · 45 citations

X-ray Spectroscopy, Sensitivity Factors, Engineering +23

Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Natalie A. Belsey, David J. H. Cant, Caterina Minelli et al. · The Journal of Physical Chemistry C · 2016 · 42 citations · Full text

Materials Science, Nanoparticles, Chemical Engineering +15

A technique for calculation of shell thicknesses for core–shell–shell nanoparticles from XPS data

David J. H. Cant, Yung‐Chen Wang, David G. Castner et al. · Surface and Interface Analysis · 2016 · 33 citations · Full text