M. Schwartzkopff

Breakdown of the<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>k</mml:mi></mml:math>-Conservation Rule in Si Nanocrystals

D. Kovalev, H. Heckler, M. Ben‐Chorin et al. · Physical Review Letters · 1998 · 285 citations

Materials Engineering, Materials Science, Math Xmlns +14

Hole burning spectroscopy of porous silicon

D. Kovalev, H. Heckler, B. Averboukh et al. · Physical review. B, Condensed matter · 1998 · 51 citations

Materials Science, Photoluminescence, Luminescence Hole +12

Observation of Coulomb staircase and negative differential resistance at room temperature by scanning tunneling microscopy

Petar Radojković, M. Schwartzkopff, M. Enachescu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 49 citations

Microscope Tip, Engineering, Microscopy +24

Luminescence of porous silicon in a weak confinement regime

G. Polisski, H. Heckler, D. Kovalev et al. · Applied Physics Letters · 1998 · 37 citations

Materials Science, Photonics, Photoluminescence +9

Electron-stimulated desorption of hydrogen from the Si(111) surface by scanning tunneling microscopy

M. Schwartzkopff, Petar Radojković, M. Enachescu et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 24 citations

Engineering, Chemistry, Tunneling Microscopy +16