Concepedia
Statistics
Publications
1
Citations
48
H-Index
Active since
2002
T. Kurasawa is an author specializing in gate oxide interfaces, engineering, and cmos reliability.
Publications per year
2002–2002
The effectiveness of IDDQ and high voltage stress for burn-in elimination [CMOS production]
Ryo Kawahara, O. Nakayama, T. Kurasawa · 2002 · 48 citations
Engineering, Electrical Engineering, Microelectronics +16
1–1 of 1