Concepedia
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Publications
1
Citations
48
H-Index
Active since
2002
O. Nakayama is an author specializing in semiconductor reliability, electrical insulation, and burn-in testing.
Publications per year
2002–2002
The effectiveness of IDDQ and high voltage stress for burn-in elimination [CMOS production]
Ryo Kawahara, O. Nakayama, T. Kurasawa · 2002 · 48 citations
Engineering, Electrical Engineering, Microelectronics +16
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