C. E. Michelson

Drive-level capacitance profiling: Its application to determining gap state densities in hydrogenated amorphous silicon films

C. E. Michelson, A. V. Gelatos, J. David Cohen · Applied Physics Letters · 1985 · 175 citations

Device Modeling, Electrical Engineering, Engineering +15

Highly Ionized Hollow Cathode Discharge

L. M. Lidsky, S. D. Rothleder, David J. Rose et al. · Journal of Applied Physics · 1962 · 131 citations

Electrical Engineering, Plasma Electronics, Engineering +14

Time Allocation in Four Societies

Ruth H. Munroe, Robert L. Munroe, C. E. Michelson et al. · Ethnology · 1983 · 49 citations · Full text

Human Ecology, Education, Social Stratification +19

Effects of the implantation of oxygen, nitrogen, and carbon on the density of states of<i>n</i>-type hydrogenated amorphous silicon

C. E. Michelson, J. David Cohen · Physical review. B, Condensed matter · 1990 · 27 citations

Materials Science, Semiconductor Technology, Engineering +13

The Current-Voltage Characteristics of Porous Anodic Oxides on Aluminum

C. E. Michelson · Journal of The Electrochemical Society · 1968 · 25 citations

Materials Science, Engineering, Nanoporous Material +5