J. David Cohen

Bulk and metastable defects in CuIn1−xGaxSe2 thin films using drive-level capacitance profiling

Jennifer Heath, J. David Cohen, William N. Shafarman · Journal of Applied Physics · 2004 · 481 citations

Engineering, Defect Tolerance, Photovoltaics +21

Measurement of the density of gap states in hydrogenated amorphous silicon by space charge spectroscopy

D. V. Lang, J. David Cohen, J. P. Harbison · Physical review. B, Condensed matter · 1982 · 475 citations

Undoped Films, Engineering, Dynamic Response +19

Calculation of the dynamic response of Schottky barriers with a continuous distribution of gap states

J. David Cohen, D. V. Lang · Physical review. B, Condensed matter · 1982 · 233 citations

Electrical Engineering, Semiconductor Device, Engineering +12

Effect of Ga content on defect states in CuIn1−xGaxSe2 photovoltaic devices

Jennifer Heath, J. David Cohen, William N. Shafarman et al. · Applied Physics Letters · 2002 · 214 citations

Engineering, Transient Photocapacitance Spectroscopy, Defect Band +17

Electronic properties of the Cu2ZnSn(Se,S)4 absorber layer in solar cells as revealed by admittance spectroscopy and related methods

Oki Gunawan, Tayfun Gokmen, Charles W. Warren et al. · Applied Physics Letters · 2012 · 205 citations

Engineering, Electronic Properties, Chemistry +20