Concepedia

Y. Li

YL

3

Publications

47

Citations

3

H-Index

2003

Active since

Affiliations

Philips (Netherlands)(Current)

Delft University of Technology

Y. Li is an author at Philips (Netherlands) specializing in electronic packaging, microelectronics, and engineering.

Top concepts

EngineeringMicroelectronicsElectronic PackagingApplied PhysicsSolid MechanicsDefect ToleranceElectrical EngineeringMechanical EngineeringPhysicsCorrosion

Publications per year

2003–2004

3

Publications

3

Prediction of back-end process-induced wafer warpage and experimental verification

R.B.R. van Silfhout, W.D. van Driel, Y. Li et al. · 2003 · 21 citations

Defect Tolerance, Large Wafer Warpage, Experimental Verification +14

Effect of metal layout design on passivation crack occurrence using both experimental and simulation techniques

R.B.R. van Silfhout, W.D. van Driel, Y. Li et al. · 2004 · 13 citations

Engineering, Mechanical Engineering, Defect Tolerance +25

ESD phenomena in interconnect structures

Theo Smedes, Y. Li · Electrical Overstress/Electrostatic Discharge Symposium · 2003 · 13 citations

Electrical Engineering, Electromigration Technique, Engineering +13

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