H. Z. Zhang

White-light-induced disruption of nanoscale conducting filament in hafnia

Yang Zhou, K. S. Yew, D. S. Ang et al. · Applied Physics Letters · 2015 · 46 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Role of interfacial layer on complementary resistive switching in the TiN/HfOx/TiN resistive memory device

H. Z. Zhang, D. S. Ang, Chenjie Gu et al. · Applied Physics Letters · 2014 · 33 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15

Enlarged read window in the asymmetric ITO/HfOx/TiN complementary resistive switch

H. Z. Zhang, D. S. Ang, You Zhou et al. · Applied Physics Letters · 2017 · 15 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Restoration of Postbreakdown Gate Oxide by White-Light Illumination

T. Kawashima, K. S. Yew, Yu Zhou et al. · IEEE Electron Device Letters · 2015 · 14 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Argon-plasma-controlled optical reset in the SiO2/Cu filamentary resistive memory stack

T. Kawashima, K. S. Yew, Yang Zhou et al. · Applied Physics Letters · 2018 · 10 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +13