W. Drube

Investigation of epitaxial LaNiO3−x thin films by high-energy XPS

S. Mickevičius, S. Grebinskij, V. Bondarenka et al. · Journal of Alloys and Compounds · 2006 · 238 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +10

X-ray Diffraction Study of the Ultrathin Al ₂ O ₃ Layer on NiAl(110)

Andreas Stierle, Frank Uwe Renner, Reinhard Streitel et al. · Science · 2004 · 165 citations

Natural Sciences, Materials Engineering, Materials Science +17

The new dedicated HAXPES beamline P22 at PETRAIII

Christoph Schlueter, A. Gloskovskii, Katrin Ederer et al. · AIP conference proceedings · 2019 · 125 citations · Full text

Natural Sciences, Chemistry, Materials Science +17

A high-pressure x-ray photoelectron spectroscopy instrument for studies of industrially relevant catalytic reactions at pressures of several bars

Peter Amann, David Degerman, Ming‐Tao Lee et al. · Review of Scientific Instruments · 2019 · 116 citations · Full text

Natural Sciences, Chemical Engineering, Chemistry +14

Hard x-ray photoelectron spectroscopy study of the electroforming in Ti/HfO2-based resistive switching structures

M. Sowińska, T. Bertaud, Damian Walczyk et al. · Applied Physics Letters · 2012 · 103 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +15