Todd C. Schwendemann

Three-dimensional imaging of short-range chemical forces with picometre resolution

Boris J. Albers, Todd C. Schwendemann, Mehmet Z. Baykara et al. · Nature Nanotechnology · 2009 · 191 citations

Engineering, Microscopy, Medicine +9

Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

Boris J. Albers, Marcus Liebmann, Todd C. Schwendemann et al. · Review of Scientific Instruments · 2008 · 68 citations

Site-specific Force Spectroscopy, Engineering, Ultrahigh Vacuum +17

Understanding Scanning Tunneling Microscopy Contrast Mechanisms on Metal Oxides: A Case Study

Harry Mönig, Milica Todorović, Mehmet Z. Baykara et al. · ACS Nano · 2013 · 58 citations

Engineering, Microscopy, Chemistry +21

Interface and electronic characterization of thin epitaxial films

C. A. F. Vaz, Hui‐Qiong Wang, Charles Ahn et al. · Surface Science · 2008 · 43 citations · Full text

Engineering, Applied Physics, Electronic Characterization +3

Atom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurements

Mehmet Z. Baykara, Milica Todorović, Harry Mönig et al. · Physical Review B · 2013 · 42 citations · Full text

Engineering, Surface Copper, Chemistry +17