Boris J. Albers

Three-dimensional imaging of short-range chemical forces with picometre resolution

Boris J. Albers, Todd C. Schwendemann, Mehmet Z. Baykara et al. · Nature Nanotechnology · 2009 · 191 citations

Engineering, Microscopy, Medicine +9

Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy

Boris J. Albers, Marcus Liebmann, Todd C. Schwendemann et al. · Review of Scientific Instruments · 2008 · 68 citations

Site-specific Force Spectroscopy, Engineering, Ultrahigh Vacuum +17

Interface and electronic characterization of thin epitaxial films

C. A. F. Vaz, Hui‐Qiong Wang, Charles Ahn et al. · Surface Science · 2008 · 43 citations · Full text

Engineering, Applied Physics, Electronic Characterization +3

Data acquisition and analysis procedures for high-resolution atomic force microscopy in three dimensions

Boris J. Albers, Todd C. Schwendemann, Mehmet Z. Baykara et al. · Nanotechnology · 2009 · 29 citations

Exploring atomic-scale lateral forces in the attractive regime: a case study on graphite (0001)

Mehmet Z. Baykara, Todd C. Schwendemann, Boris J. Albers et al. · Nanotechnology · 2012 · 12 citations

Lateral Forces, Nanosheet, Engineering +24