F. M. Collins

Statistics

Publications

Citations

182

H-Index

Active since

1990

Affiliations

University at Buffalo, State University of New York(Current)

Niagara University

F. M. Collins is an author at University at Buffalo, State University of New York specializing in thin-film materials, materials science, and thin film electrical properties.

Publications per year

1990–1995

Publications

Stability of tantalum nitride thin film resistors

Chi Au, Wayne A. Anderson, D. Schmitz et al. · Journal of materials research/Pratt's guide to venture capital sources · 1990 · 71 citations

Engineering, Materials Engineering, Materials Science +12

Reactively sputtered RuO2 thin film resistor with near zero temperature coefficient of resistance

Q. X. Jia, Zhenqi Shi, K.L. Jiao et al. · Thin Solid Films · 1991 · 66 citations

Natural Sciences, Materials Engineering, Materials Science +15

Development and fabrication of RuO2 thin film resistors

Q. X. Jia, K.L. Jiao, Wayne A. Anderson et al. · Materials Science and Engineering B · 1993 · 19 citations

Natural Sciences, Materials Engineering, Materials Science +11

Stable thin film resistors using double layer structure

Q. X. Jia, H.J. Lee, Erming Ma et al. · Journal of materials research/Pratt's guide to venture capital sources · 1995 · 15 citations

Natural Sciences, Electrical Engineering, Materials Science +14

Microstructural analysis and modeling of RuO2 thin film resistors

Q. X. Jia, K.L. Jiao, Wayne A. Anderson et al. · Materials Science and Engineering B · 1993 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +12

1–5 of 5