Benjamin Uhlig

A Survey of Carbon Nanotube Interconnects for Energy Efficient Integrated Circuits

Aida Todri‐Sanial, R. Ramos, Hanako Okuno et al. · IEEE Circuits and Systems Magazine · 2017 · 35 citations · Full text

Engineering, Vlsi Design, Integrated Circuits +16

Understanding Electromigration in Cu-CNT Composite Interconnects: A Multiscale Electrothermal Simulation Study

Jaehyun Lee, Salim Berrada, Fikru Adamu-Lema et al. · IEEE Transactions on Electron Devices · 2018 · 19 citations · Full text

Engineering, Thermal Conductivity, Wafer Scale Processing +20

Investigation of Pt-Salt-Doped-Standalone- Multiwall Carbon Nanotubes for On-Chip Interconnect Applications

Jie Liang, Rongmei Chen, R. Ramos et al. · IEEE Transactions on Electron Devices · 2019 · 17 citations · Full text

Engineering, On-chip Interconnect Applications, Nanocomputing +22

Influences and Diffusion Effects of Lithium Contamination during the Thermal Oxidation Process of Silicon

Annika Franziska Wandesleben, Delphine Truffier‐Boutry, F. Glowacki et al. · Advanced Engineering Materials · 2024 · 14 citations · Full text

Progress on carbon nanotube BEOL interconnects

Benjamin Uhlig, Jie Liang, Jaehyun Lee et al. · 2018 · 12 citations · Full text

Engineering, Vlsi Design, Integrated Circuits +16