Kyoichi Ichinoseki

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Active since

2007

Affiliations

National Institute of Advanced Industrial Science and Technology(Current)

Toshiba (Japan)

Kyoichi Ichinoseki is an author at National Institute of Advanced Industrial Science and Technology specializing in semiconductor devices, semiconductor device materials, and engineering.

Publications per year

2007–2010

Publications

Influence of Processing and of Material Defects on the Electrical Characteristics of SiC-SBDs and SiC-MOSFETs

Kenji Fukuda, Akimasa Kinoshita, Takasumi Ohyanagi et al. · Materials science forum · 2010 · 21 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of Oxidation Conditions and Surface Defects on the Reliability of Large-Area Gate Oxide on the C-Face of 4H-SiC

Tetsuo Hatakeyama, Takuma Suzuki, Kyoichi Ichinoseki et al. · Materials science forum · 2010 · 16 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Evaluation of the quality of commercial silicon carbide wafers by an optical non-destructive inspection technique

Tetsuo Hatakeyama, Kyoichi Ichinoseki, K. Fukuda et al. · Journal of Crystal Growth · 2007 · 12 citations

Engineering, Manufacturing Engineering, Materials Engineering +14

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