Hao Zhang

Study on the single-event burnout mechanism of p-GaN gate AlGaN/GaN HEMTs

Xiaohu Wang, Xuefeng Zheng, Danmei Lin et al. · Applied Physics Letters · 2024 · 33 citations

Engineering, Electrical Engineering, Materials Science +17

Leakage current reduction in <i>β</i>-Ga2O3 Schottky barrier diode with p-NiOx guard ring

Yuehua Hong, Xuefeng Zheng, Yunlong He et al. · Applied Physics Letters · 2022 · 27 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Linearity Enhancement of AlGaN/GaN HEMTs With Selective-Area Charge Implantation

Fang Zhang, Xuefeng Zheng, Hao Zhang et al. · IEEE Electron Device Letters · 2022 · 19 citations

Engineering, Electrical Engineering, Materials Science +17

Enhancing performance of β-Ga2O3 diodes through a NixO/SiNx/Ga2O3 sandwich structure

Yuehua Hong, Xuefeng Zheng, Yunlong He et al. · Journal of Alloys and Compounds · 2023 · 18 citations

Engineering, Materials Engineering, Materials Science +12

Study on the single-event burnout mechanism of GaN MMIC power amplifiers

Hao Zhang, Xuefeng Zheng, Danmei Lin et al. · Applied Physics Letters · 2024 · 14 citations · Full text

Engineering, Electrical Engineering, Materials Science +17