J. Taylor - Concepedia

Author

J. Taylor

Philips (United States)

Also Known As

J Taylor, J. C. Taylor, J. Taylor, Jeanne M. Taylor, Jeanne Taylor

Publications

289

Citations

H-Index

Concepts

All Affiliations

Philips (United States)

About

J. Taylor is an author at Philips (United States) specializing in engineering, instrumentation, and calibration.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	184
2	Health Sciences	4	4	110
3	Applied Physics	3	3	54
4	Education	2	2	26
5	Natural Sciences	1	1	56

J. Taylor

Publications

276

Citations

H-Index

Page 1

	Year	Citations
Effect of HRT, SRT and temperature on the performance of activated sludge reactors treating bleached kraft mill effluent Tanya Alexandra Barr, J. Taylor, Sheldon J.B. Duff Water Research Sludge ReactorsSewage Sludge TreatmentChemical EngineeringEngineeringEffluent Disposal	1996	82
Absorption and Counting-Efficiency Data for X-Ray Detectors J. Taylor, W. Parrish Review of Scientific Instruments Counting-efficiency DataX-ray SpectroscopyRadiation DetectionPhysicsHealth Sciences	1955	56
Interpretation of diffractometer line profiles J. Ladell, W. Parrish, J. Taylor Acta Crystallographica	1959	36
Experimental Study of Effect of Crystallite Size Statistics on X-Ray Diffractometer Intensities Philippe Wolff, J. Taylor, W. Parrish Journal of Applied Physics X-ray CrystallographyEngineeringPolycapillary OpticsX-ray ImagingStationary Specimens	1959	33
Center-of-gravity method of precision lattice parameter determination J. Ladell, W. Parrish, J. Taylor Acta Crystallographica Numerical AnalysisPrecision MeasurementEngineeringExperimental GravityCalibration	1959	22
Evaluation of truncation methods for accurate centroid lattice parameter determination J. Taylor, M. Mack, W. Parrish Acta Crystallographica Truncation MethodsEngineeringRadiation DetectionMeasurementCalibration	1964	16
Determination of apertures in the focusing plane of X-ray powder diffractometers W. Parrish, M. Mack, J. Taylor Journal of Scientific Instruments EngineeringMicroscopySlit WidthsPolycapillary OpticsX-ray Imaging	1966	11
Dispersion, Lorentz and polarization in the centroid method of precision lattice parameter determination J. Ladell, M. Mack, W. Parrish, Acta Crystallographica Numerical AnalysisPrecision MeasurementEngineeringPhysicsMeasurement	1959	10
Dependence of Lattice Parameters on Various Angular Measures of Diffractometer Line Profiles<sup>*</sup> W. Parrish, J. Taylor, M. Mack Advances in X-ray Analysis X-ray SpectroscopyEngineeringMeasurementOptical TestingX-ray Imaging	1963	10

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