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P.J. vd Wel

PV

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Publications

1

Citations

17

H-Index

1

Active since

2014

Affiliations

NXP (Netherlands)(Current)

P.J. vd Wel is an author at NXP (Netherlands) specializing in reliability, electronic packaging, and engineering.

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Publications per year

2014–2014

1

Publications

1

Reliability of Wafer Level Chip Scale Packages

R.T.H. Rongen, R. Roucou, P.J. vd Wel et al. · Microelectronics Reliability · 2014 · 17 citations

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