Trevor Pi-Chun Juan

Fabrication and characterization of metal-ferroelectric (PbZr0.53Ti0.47O3)-insulator (Dy2O3)-semiconductor capacitors for nonvolatile memory applications

Chung-Yuan Chang, Trevor Pi-Chun Juan, Joseph Ya‐min Lee · Applied Physics Letters · 2006 · 73 citations · Full text

Materials Science, Semiconductors, Electrical Engineering +15

Temperature dependence of the current conduction mechanisms in ferroelectric Pb(Zr0.53,Ti0.47)O3 thin films

Trevor Pi-Chun Juan, Simin Chen, Joseph Ya‐min Lee · Journal of Applied Physics · 2004 · 62 citations

Engineering, Temperature Dependence, Energy Band Diagram +17

A New Metal–Ferroelectric$(hboxPbZr_0.53hboxTi_0.47hboxO_3)$–Insulator$(hboxDy_2hboxO_3)$–Semiconductor (MFIS) FET for Nonvolatile Memory Applications

Trevor Pi-Chun Juan, Chun‐Fa Chang, J.Y. Lee · IEEE Electron Device Letters · 2006 · 59 citations

Materials Science, Semiconductors, Oxide Heterostructures +14

Fabrication and characterization of metal-ferroelectric (PbZr0.6Ti0.4O3)-insulator (La2O3)-semiconductor capacitors for nonvolatile memory applications

Trevor Pi-Chun Juan, Cheng‐Li Lin, Wen-Chieh Shih et al. · Journal of Applied Physics · 2009 · 25 citations

Materials Science, Semiconductors, Electrical Engineering +15

Improvement on Reliability Properties of Metal-Ferroelectric (BiFeO[sub 3])-Insulator (HfO[sub 2])-Semiconductor Structures Fabricated by Oxygen-Incorporated Magnetron Sputtering

Trevor Pi-Chun Juan, Jong‐Hong Lu, Mingwei Lu · Journal of The Electrochemical Society · 2008 · 11 citations

Engineering, -Semiconductor Structures, Phase Change Memory +17