Khin Maung Latt

New Analysis Methods On Strict Avalanche Criterion Of S-Boxes

Phyu Phyu Mar, Khin Maung Latt · Zenodo (CERN European Organization for Nuclear Research) · 2008 · 31 citations · Full text

The impact of layer thickness of IMP-deposited tantalum nitride films on integrity of Cu/TaN/SiO2/Si multilayer structure

Khin Maung Latt, Y.K Lee, S Li et al. · Materials Science and Engineering B · 2001 · 28 citations

Materials Engineering, Materials Science, Layer Thickness +10

Formation of Cu diffusion channels in Ta layer of a Cu/Ta/SiO2/Si structure

Shaozhi Li, Zhili Dong, Khin Maung Latt et al. · Applied Physics Letters · 2002 · 22 citations · Full text

Engineering, Chemistry, Silicon On Insulator +20

Study of diffusion barrier properties of ionized metal plasma (IMP) deposited TaN between Cu and SiO2

Y.K Lee, Khin Maung Latt, Jae‐Hyung Kim et al. · Materials Science in Semiconductor Processing · 2000 · 21 citations

Materials Science, Ion Implantation, Engineering +8

Interfacial reactions and failure mechanism of Cu/Ta/SiO2/Si multilayer structure in thermal annealing

Khin Maung Latt, Y.K. Lee, T. Osipowicz et al. · Materials Science and Engineering B · 2002 · 18 citations

Materials Science, Materials Engineering, Interfacial Reactions +11