J. Šik

Optical properties and phase change transition in Ge2Sb2Te5 flash evaporated thin films studied by temperature dependent spectroscopic ellipsometry

J. Orava, T. Wágner, J. Šik et al. · Journal of Applied Physics · 2008 · 118 citations

Optical Materials, Engineering, Thin Film Process Technology +17

Optical functions of silicon at high temperatures

J. Šik, Jaroslav Hora, J. Humlı́ček · Journal of Applied Physics · 1998 · 82 citations

Optical Materials, Engineering, Optical Functions +16

Band-gap energies, free carrier effects, and phonon modes in strained GaNAs/GaAs and GaNAs/InAs/GaAs superlattice heterostructures measured by spectroscopic ellipsometry

J. Šik, M. Schubert, G. Leibiger et al. · Journal of Applied Physics · 2001 · 48 citations

Wide-bandgap Semiconductor, Optical Materials, Engineering +21

Free-carrier effects and optical phonons in GaNAs/GaAs superlattice heterostructures measured by infrared spectroscopic ellipsometry

J. Šik, M. Schubert, Tino Hofmann et al. · MRS Internet Journal of Nitride Semiconductor Research · 2000 · 46 citations · Full text

Nitrogen dependence of the GaAsN interband critical points E1 and E1+Δ1 determined by spectroscopic ellipsometry

G. Leibiger, V. Gottschalch, B. Rheinländer et al. · Applied Physics Letters · 2000 · 43 citations

E1 Energy, Engineering, Semiconductor Nanostructures +17