Jaewoong Shim

Active Learning of Convolutional Neural Network for Cost-Effective Wafer Map Pattern Classification

Jaewoong Shim, Seokho Kang, Sungzoon Cho · IEEE Transactions on Semiconductor Manufacturing · 2020 · 69 citations

Computing, Computer Science, Manufacturing Engineering +16

Mining the relationship between production and customer service data for failure analysis of industrial products

Seokho Kang, Eunji Kim, Jaewoong Shim et al. · Computers & Industrial Engineering · 2017 · 37 citations

Management, Industrial Engineering, Manufacturing Engineering +16

Learning from single-defect wafer maps to classify mixed-defect wafer maps

Jaewoong Shim, Seokho Kang · Expert Systems with Applications · 2023 · 28 citations

Computing, Computer Engineering, Computer Science +13

Product failure prediction with missing data

Seokho Kang, Eunji Kim, Jaewoong Shim et al. · International Journal of Production Research · 2017 · 25 citations

Computing, Data Science, Manufacturing Engineering +17

Active cluster annotation for wafer map pattern classification in semiconductor manufacturing

Jaewoong Shim, Seokho Kang, Sungzoon Cho · Expert Systems with Applications · 2021 · 23 citations

Computing, Computer Engineering, Manufacturing Engineering +15