Statistics
Publications
1
Citations
10
H-Index
1
Active since
2009
Affiliations
Maxim Integrated (United States)(Current)
Robert Derk is an author at Maxim Integrated (United States) specializing in semiconductor reliability, packaging reliability testing, and failure analysis.
Publications per year
2009–2009
1
1
Larger Array Fine Pitch Wafer Level Package Drop Test Reliability
Tiao Zhou, Robert Derk, Kaysar Rahim et al. · 2009 · 10 citations
Engineering, Materials Engineering, Electronic Materials +16
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