Adel Kalboussi

Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics

Slah Hlali, Neila Hizem, L. Militaru et al. · Microelectronics Reliability · 2017 · 34 citations

Engineering, Electrical Engineering, Materials Science +17

TCAD Simulations of graphene field-effect transistors based on the quantum capacitance effect

Bilel Hafsi, Aïmen Boubaker, Naoufel Ismaïl et al. · Journal of the Korean Physical Society · 2015 · 28 citations

Engineering, Electrical Engineering, Materials Science +16

Analysis of photogenerated random telegraph signal in single electron detector (photo-SET)

M. Troudi, N. Sghaier, Adel Kalboussi et al. · Optics Express · 2009 · 26 citations · Full text

Engineering, Materials Science, Physics +17

High temperature and voltage dependent electrical and dielectric properties of TiN/Al2O3/p-Si MIS structure

Slah Hlali, Abdelaali Farji, Neila Hizem et al. · Journal of Alloys and Compounds · 2017 · 26 citations

Natural Sciences, Materials Engineering, Materials Science +15

High-Sensitivity Sensor Using C₆₀-Single Molecule Transistor

Abdelghaffar Nasri, Aïmen Boubaker, B. Hafsi et al. · IEEE Sensors Journal · 2017 · 23 citations

Natural Sciences, Chemistry, Materials Science +17