E. Dornberger

Defect engineering of Czochralski single-crystal silicon

Talid Sinno, E. Dornberger, Wilfried von Ammon et al. · Materials Science and Engineering R Reports · 2000 · 138 citations

Materials Engineering, Materials Science, Engineering +5

Point Defect Dynamics and the Oxidation‐Induced Stacking‐Fault Ring in Czochralski‐Grown Silicon Crystals

Talid Sinno, Robert A. Brown, Wilfried von Ammon et al. · Journal of The Electrochemical Society · 1998 · 119 citations

Engineering, Crystal Growth Technology, Oxidation‐induced Stacking‐fault Ring +16

The dependence of bulk defects on the axial temperature gradient of silicon crystals during Czochralski growth

Wilfried von Ammon, E. Dornberger, Hans Oelkrug et al. · Journal of Crystal Growth · 1995 · 108 citations

Materials Science, Materials Engineering, Bulk Defects +12

The Dependence of Ring‐Like Distributed Stacking Faults on the Axial Temperature Gradient of Growing Czochralski Silicon Crystals

E. Dornberger, Wilfried von Ammon · Journal of The Electrochemical Society · 1996 · 108 citations

Materials Science, Engineering, Physics +15

The impact of nitrogen on the defect aggregation in silicon

Wilfried von Ammon, R. Hölzl, J. Virbulis et al. · Journal of Crystal Growth · 2001 · 92 citations

Materials Engineering, Engineering, Crystalline Defects +10