B. K. Mathur

Structural characterization of Bi2−xSbxS3 films prepared by the dip-dry method

B.B. Nayak, H. N. Acharya, G. B. Mitra et al. · Thin Solid Films · 1983 · 87 citations

Materials Science, Materials Engineering, Multiferroics +8

Electrical and interfacial characteristics of ultrathin ZrO2 gate dielectrics on strain compensated SiGeC/Si heterostructure

Rajat Mahapatra, Je‐Hun Lee, S. Maikap et al. · Applied Physics Letters · 2003 · 43 citations

Strain-compensated Si0.69ge0.3c0.01 Layers, Engineering, Sigec Films +17

Evaluation of the scaling exponent of self-affine fractal surface from a single scanning probe microscope image

M V Hanumantha Rao, B. K. Mathur, K. L. Chopra · Applied Physics Letters · 1994 · 36 citations

Engineering, Microscopy, Single Topographic Image +21

Electrical, Optical, and Scanning Tunneling Microscopic Studies on Layer Type CdIn₂S_4-<i>_x</i>Se<i>_x</i> (1.75 ≤ <i>x</i> ≤ 2.75)

S. K. Srivastava, Monoj Pramanik, Debashis Palit et al. · Chemistry of Materials · 2001 · 35 citations

Engineering, Fault Probability, Semiconductor Nanostructures +19

Nanostructured icosahedral phase formation in Al70Cu20Fe10 by mechanical alloying: Comprehensive study

P. Barua, B.S. Murty, B. K. Mathur et al. · Journal of Applied Physics · 2002 · 30 citations

Magnetic Properties, Engineering, Severe Plastic Deformation +16