M.J. Cushing

Comparison of electronics-reliability assessment approaches

M.J. Cushing, D.E. Mortin, Thomas Stadterman et al. · IEEE Transactions on Reliability · 1993 · 114 citations

Engineering, Measurement, Reliability-based Design +19

A physics-of-failure (POF) approach to addressing device reliability in accelerated testing of MCMs

John Evans, M.J. Cushing, Pradeep Lall et al. · 2002 · 15 citations

Engineering, Measurement, Mem Testing +24

Consideration of component failure mechanisms in the reliability assessment of electronic equipment-addressing the constant failure rate assumption

D.E. Mortin, J.G. Krolewski, M.J. Cushing · 2002 · 12 citations

Engineering, Industrial Engineering, Reliability Assessment +26

U.S. Army reliability standardization improvement policy and its impact

M.J. Cushing, J.G. Krolewski, Thomas Stadterman et al. · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 1996 · 11 citations

Reliability, Reliability Engineering, Engineering +14