M. Bicker

Decomposition and nanocrystallization in reactively sputtered amorphous Ta–Si–N thin films

C. U. Pinnow, M. Bicker, U. Geyer et al. · Journal of Applied Physics · 2001 · 106 citations · Full text

Materials Science, Engineering, Crystalline Defects +15

Hydrogen-induced stress in Nb single layers

U. Laudahn, Astrid Pundt, M. Bicker et al. · Journal of Alloys and Compounds · 1999 · 81 citations

Materials Science, Engineering, Hydrogen Transition +5

Determination of elastic constants in thin films using hydrogen loading

U. Laudahn, S. Fähler, Hans‐Ulrich Krebs et al. · Applied Physics Letters · 1999 · 51 citations

Engineering, Hydrogen Loading, Hydrogen Embrittlement +18

Optical deflection setup for stress measurements in thin films

M. Bicker, U. von Hülsen, U. Laudahn et al. · Review of Scientific Instruments · 1998 · 31 citations

Optical Materials, Engineering, Optical Testing +20

Nanocrystallization of amorphous-Ta40Si14N46 diffusion barrier thin films

M. Bicker, C. U. Pinnow, U. Geyer et al. · Applied Physics Letters · 2001 · 11 citations

Engineering, Solid-state Chemistry, Thin Film Process Technology +16