U. von Hülsen

Hydrogen-induced stress in Nb single layers

U. Laudahn, Astrid Pundt, M. Bicker et al. · Journal of Alloys and Compounds · 1999 · 81 citations

Materials Science, Engineering, Hydrogen Transition +5

Determination of elastic constants in thin films using hydrogen loading

U. Laudahn, S. Fähler, Hans‐Ulrich Krebs et al. · Applied Physics Letters · 1999 · 51 citations

Engineering, Hydrogen Loading, Hydrogen Embrittlement +18

Internal interfaces and intrinsic stress in thin amorphous Cu-Ti and Co-Tb films

U. Geyer, U. von Hülsen, Hartmut Köpf · Journal of Applied Physics · 1998 · 41 citations

Engineering, Thin Film Process Technology, Intrinsic Stress Formation +17

Optical deflection setup for stress measurements in thin films

M. Bicker, U. von Hülsen, U. Laudahn et al. · Review of Scientific Instruments · 1998 · 31 citations

Optical Materials, Engineering, Optical Testing +20

Surface roughening and columnar growth of thin amorphous CuTi films

U. Geyer, U. von Hülsen, P. Thiyagarajan · Applied Physics Letters · 1997 · 16 citations

Materials Science, Column Boundaries, Surface Roughening +14