Size-dependent radiative decay time of confined excitons in CuCl microcrystals

T. Itoh, M. Furumiya, Tsuyoshi Ikehara, +1

Solid State Communications

Localized Excited StateEngineeringPhysicsApplied PhysicsQuantum Materials +5

A 2.5 kV Isolation 35 kV/us CMR 250 Mbps Digital Isolator in Standard CMOS With a Small Transformer Driving Technique

Shunichi Kaeriyama, Shin‐ichi Uchida, M. Furumiya, +3

IEEE Journal of Solid-State Circuits

Low-power ElectronicsKv Isolation 35Electrical EngineeringCmos ChipPower Control Systems +11

Size-dependent homogeneous broadening of confined excitons in CuCl microcrystals

Tadashi Itoh, M. Furumiya

Journal of Luminescence

EngineeringPhysicsSize-dependent Homogeneous BroadeningNanotechnologyApplied Physics +4

High-sensitivity and no-crosstalk pixel technology for embedded CMOS image sensor

M. Furumiya, H. Ohkubo, Yoshinori Muramatsu, +4

IEEE Transactions on Electron Devices

Electrical EngineeringPhotoelectric SensorVisible LightEngineeringMixed-signal Integrated Circuit +10

A signal-processing CMOS image sensor using a simple analog operation

Yoshinori Muramatsu, S. Kurosawa, M. Furumiya, +2

IEEE Journal of Solid-State Circuits

Normal-readout ModeEngineeringData ConverterDynamic RangeAnalog Design +12

High sensitivity and no-cross-talk pixel technology for embedded CMOS image sensor

M. Furumiya, H. Ohkubo, Yoshinori Muramatsu, +2

Electrical EngineeringPhotoelectric SensorEngineeringHigh SensitivityDeep P-well Photodiode +12

A 2/3-inch 2 M-pixel IT-CCD image sensor with individual p-wells for separate V-CCD and H-CCD formation

M. Morimoto, K. Orihara, N. Mutoh, +17

Horizontal CcdElectrical EngineeringSeparate V-ccdEngineeringCcd Image Sensor +8

A 2.5kV isolation 35kV/us CMR 250Mbps 0.13mA/Mbps digital isolator in standard CMOS with an on-chip small transformer

Shunichi Kaeriyama, Shin‐ichi Uchida, M. Furumiya, +2

Low-power ElectronicsElectrical EngineeringCmos ChipEngineeringPower Ic +12

Optical limitations to cell size reduction in IT-CCD image sensors

Takashi Satoh, N. Mutoh, M. Furumiya, +12

IEEE Transactions on Electron Devices

Photonic SensorVisible LightEngineeringMicroscopyOptical Testing +16

A 1/4-inch 380 k pixel IT-CCD image sensor employing gate-assisted punchthrough read-out mode

N. Mutoh, K. Orihara, Y. Kawakami, +12

IEEE Transactions on Electron Devices

Read-out ModeEngineeringMicroscopyIntegrated CircuitsImage Sensor +21