A. S. Kolomiitsev

Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy

Yu. F. Blinov, O. I. Il’in, A. S. Kolomiitsev et al. · Technical Physics · 2013 · 42 citations

Formation of a memristor matrix based on titanium oxide and investigation by probe-nanotechnology methods

V I Avilov, A. S. Kolomiitsev, V. A. Smirnov et al. · Semiconductors · 2014 · 27 citations

Probe modification for scanning-probe microscopy by the focused ion beam method

V. A. Smirnov, A. S. Kolomiitsev, N. I. Serbu · Russian Microelectronics · 2012 · 26 citations

Studying the Regimes of Silicon Surface Profiling by Focused Ion Beams

I N Kots, A. S. Kolomiitsev, S A Lisitsyn et al. · Russian Microelectronics · 2019 · 22 citations

Development of a technique for determining Young’s modulus of vertically aligned carbon nanotubes using the nanoindentation method

O. I. Il’in, A. S. Kolomiitsev, V. A. Smirnov et al. · Nanotechnologies in Russia · 2012 · 20 citations