Charles Slayman - Concepedia

Author

Charles Slayman

HRL Laboratories (United States)

Also Known As

C. Slayman, C. W. Slayman, C.W. Slayman, Charles Slayman, Charles W. Slayman

Publications

732

Citations

H-Index

Concepts

All Affiliations

HRL Laboratories (United States)Oracle (United States)Infineon Technologies (Germany)Honeywell (United States)Cisco Systems (United States)

About

Charles Slayman is an author at HRL Laboratories (United States) specializing in engineering, electrical engineering, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	12	15	650
2	Applied Physics	8	8	201
3	Natural Sciences	3	3	65
4	Education	2	2	39
5	Chemistry	1	1	10

Charles Slayman

Publications

650

Citations

H-Index

Page 1

	Year	Citations
Cache and memory error detection, correction, and reduction techniques for terrestrial servers and workstations Charles Slayman IEEE Transactions on Device and Materials Reliability EngineeringMem TestingComputer ArchitectureMulti-channel Memory ArchitecturePerformance Issue	2005	196
Soft error trends and mitigation techniques in memory devices Charles Slayman EngineeringEnergetic ParticleEmerging Memory TechnologyMem TestingComputer Architecture	2011	64
Comparison of accelerated DRAM soft error rates measured at component and system level Ludger Borucki, Guenter Schindlbeck, Charles Slayman EngineeringNuclear PhysicsMem TestingComputer ArchitectureSystem Level	2008	58
High-frequency characteristics of GaAlAs injection lasers L. Figueroa, Charles Slayman, Huan-Wun Yen IEEE Journal of Quantum Electronics EngineeringLaser ScienceOscillatorsLaser ApplicationsLaser Material	1982	53
Frequency and pulse response of a novel high-speed interdigital surface photoconductor (IDPC) Charles Slayman, L. Figueroa IEEE Electron Device Letters EngineeringIntegrated CircuitsInterconnect (Integrated Circuits)Image SensorPhotoelectric Sensor	1981	50
A novel heterostructure interdigital photodetector (HIP) with picosecond optical response L. Figueroa, Charles Slayman IEEE Electron Device Letters Picosecond Optical ResponseEngineeringOptoelectronic DevicesIntegrated CircuitsPhotoelectric Sensor	1981	42
Theoretical Correlation of Broad Spectrum Neutron Sources for Accelerated Soft Error Testing Charles Slayman IEEE Transactions on Nuclear Science Several Broad SpectrumAccelerated Soft ErrorEngineeringNuclear PhysicsPhysics	2010	39
Masked ion-beam lithography: A feasibility demonstration for submicrometer device fabrication J. L. Bartelt, Charles Slayman, John Wood, Journal of Vacuum Science and Technology Optical MaterialsEngineeringElectron-beam LithographyMicroscopyIntegrated Circuits	1981	32
Soft errors — Past history and recent discoveries Charles Slayman Electrical EngineeringError AnalysisEngineeringThermal NeutronsPhysics	2010	28
Impact of Error Correction Code and Dynamic Memory Reconfiguration on High-Reliability/Low-Cost Server Memory Charles Slayman, Manny Ma, Scott Lindley IEEE International Integrated Reliability Workshop final report EngineeringMem TestingComputer ArchitectureHigh-reliability/low-cost Server MemoryMulti-channel Memory Architecture	2006	21

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