Statistics
Publications
2
Citations
38
H-Index
2
Active since
2009
Affiliations
Shijing Yao is an author at Texas Instruments (United States) specializing in device characterization, metal-oxide-semiconductor field-effect transistor modeling, and short-channel effects.
Publications per year
2009–2010
2
2
Design of FinFET SRAM Cells Using a Statistical Compact Model
Darsen D. Lu, Chung-Hsun Lin, Shijing Yao et al. · 2009 · 21 citations
Engineering, Computer Engineering, Electrical Engineering +17
Global parameter extraction for a multi-gate MOSFETs compact model
Shijing Yao, Tanvir Morshed, Darsen D. Lu et al. · 2010 · 17 citations
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