C. R. Bonapace

Analysis of low-energy electron diffraction and angle-resolved photoemission from InP(110)-p(1 × 1)-Sb (1 ML)

C. B. Duke, C. Mailhiot, A. Paton et al. · Surface Science · 1985 · 60 citations

Physics, Electron Spectroscopy, Applied Physics +4

Electron energy loss spectroscopy from GaAs(110) interfaces

C. R. Bonapace, D.-W. Tu, K. Li et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1985 · 39 citations

Semiconductors, Ii-vi Semiconductor, Electrical Engineering +11

Structure of the Al–GaP(110) and Al–InP(110) interfaces

Antoine Kahn, C. R. Bonapace, C. B. Duke et al. · Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena · 1983 · 36 citations

Materials Science, Semiconductors, Room Temperature +13

Dynamical analysis of low-energy electron-diffraction intensities from InAs(110)

C. B. Duke, A. Paton, Antoine Kahn et al. · Physical review. B, Condensed matter · 1983 · 32 citations

Engineering, Truncated Bulk Surface, Electron Diffraction +16

Dynamical analysis of low-energy electron diffraction intensities from Al on GaP(110): The high-coverage A1P(110) limit

C. B. Duke, A. Paton, Antoine Kahn et al. · Physical review. B, Condensed matter · 1983 · 23 citations

Aluminium Nitride, X-ray Spectroscopy, Engineering +18