Chur‐Shyang Fuh

Effect of Annealing on Defect Elimination for High Mobility Amorphous Indium-Zinc-Tin-Oxide Thin-Film Transistor

Chur‐Shyang Fuh, Po‐Tsun Liu, Wei‐Hsun Huang et al. · IEEE Electron Device Letters · 2014 · 88 citations

Materials Engineering, Materials Science, Electrical Engineering +15

Effects of Microwave Annealing on Nitrogenated Amorphous In-Ga-Zn-O Thin-Film Transistor for Low Thermal Budget Process Application

Chur‐Shyang Fuh, Po‐Tsun Liu, Li‐Feng Teng et al. · IEEE Electron Device Letters · 2013 · 73 citations

Materials Science, Electrical Engineering, Thin-film Transistor +12

Ambient Stability Enhancement of Thin-Film Transistor With InGaZnO Capped With InGaZnO:N Bilayer Stack Channel Layers

Po‐Tsun Liu, Yi‐Teh Chou, Li‐Feng Teng et al. · IEEE Electron Device Letters · 2011 · 48 citations

Bilayer Stack Structure, Electrical Engineering, Thin-film Transistor +13

Effects of Nitrogen on Amorphous Nitrogenated InGaZnO (a-IGZO:N) Thin Film Transistors

Po‐Tsun Liu, Chih‐Hsiang Chang, Chur‐Shyang Fuh et al. · Journal of Display Technology · 2016 · 31 citations

Materials Science, Amorphous Nitrogenated Ingazno, Electrical Engineering +12