V. B. Molodkin

The integrated intensities of the Laue-diffracted X-rays for monocrystals containing macroscopically homogeneously distributed defects

V. B. Molodkin, S. I. Olikhovskii, M. E. Osinovskii et al. · physica status solidi (a) · 1985 · 43 citations

X-ray Crystallography, Integrated Intensities, Engineering +21

Defect‐Pattern‐Induced Fingerprints in the Electron Density of States of Strained Graphene Layers: Diffraction and Simulation Methods

Taras M. Radchenko, V. A. Tatarenko, V. V. Lizunov et al. · physica status solidi (b) · 2019 · 40 citations

Engineering, Defect Tolerance, Semiconductors +17

The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction

V.V. Kochelab, V. B. Molodkin, S. I. Olikhovskii et al. · physica status solidi (a) · 1988 · 39 citations

X-ray Crystallography, X-ray Spectroscopy, Engineering +20

Bragg Diffraction of X-Rays by Single Crystals with Large Microdefects

S. I. Olikhovskii, V. B. Molodkin, E. N. Kislovskii et al. · physica status solidi (b) · 2002 · 37 citations

X-ray Crystallography, Engineering, Bragg Diffraction +16

Bragg Diffraction of X-Rays by Single Crystals with Large Microdefects I. Generalized Dynamical Theory

V. B. Molodkin, S. I. Olikhovskii, E. N. Kislovskii et al. · physica status solidi (b) · 2001 · 35 citations

X-ray Crystallography, Single Crystals, Optical Materials +23