Heui-Jae Pahk - Concepedia

Author

Heui-Jae Pahk

Seoul National University

Also Known As

H J Pahk, H. J. Pahk, H.J Pahk, H.J. Pahk, Heui-Jae Pahk, HeuiJae Pahk, Heuijae Pahk, Heui‐Jae Pahk, Heui‐jae Pahk

Publications

456

Citations

H-Index

Concepts

All Affiliations

Seoul National University Pohang University of Science and Technology Daewoo Electronics (South Korea)Korea Institute of Science and Technology Institute of Science and Technology

About

Heui-Jae Pahk is an author at Seoul National University specializing in engineering, instrumentation, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	374
2	Education	7	7	144
3	Applied Physics	7	7	141
4	Computer Engineering	4	4	93
5	Natural Sciences	1	1	31

Heui-Jae Pahk

Publications

374

Citations

H-Index

Page 1

	Year	Citations
Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry Taeyong Jo, Kwangrak Kim, Seongryong Kim, Journal of the Optical Society of Korea Optical MaterialsEngineeringMicroscopyOptical TestingWhite Light	2014	33
Development of straightness measurement technique using the profile matching method Heui-Jae Pahk, Joong Shin Park, In‐Sung Yeo International Journal of Machine Tools and Manufacture Sensor CalibrationEngineeringMeasurementCalibrationStructural Health Monitoring	1997	31
Integrated precision inspection system for manufacturing of moulds having CAD defined features Heui-Jae Pahk, Min-Po Jung, S. W. Hwang, The International Journal of Advanced Manufacturing Technology Geometric ModelingIndustrial DesignEngineeringIndustrial EngineeringNatural Sciences	1995	31
Development of Computer-Aided Inspection System with CMM for Integrated Mold Manufacturing Heui-Jae Pahk, Y.H. Kim, Yeh-Sun Hong, CIRP Annals Computer-aided Inspection SystemIndustrial DesignEngineeringIndustrial EngineeringMechanical Engineering	1993	31
3D Measurement of TSVs Using Low Numerical Aperture White-Light Scanning Interferometry Taeyong Jo, Seongryong Kim, Heui-Jae Pahk Journal of the Optical Society of Korea EngineeringMeasurementOptical TestingSilicon ViasInterferometry	2013	27
A HYBRID-TYPE ACTIVE VIBRATION ISOLATION SYSTEM USING NEURAL NETWORKS Kitak Ahn, Heui-Jae Pahk, Merten Jung, Journal of Sound and Vibration EngineeringMechanical SystemsStructural Health MonitoringSystems EngineeringNonlinear Vibration Control	1996	26
Automatic defect classification of TFT-LCD panels using machine learning Seokho Kang, J. H. Lee, Kaiyou Song, EngineeringMachine LearningComputer-aided DesignDefect ClassificationSupport Vector Machine	2009	24
Real-time application of critical dimension measurement of TFT-LCD pattern using a newly proposed 2D image-processing algorithm Jeongho Lee, You-Sik Kim, Sung-Ryoung Kim, Optics and Lasers in Engineering EngineeringDisplay TechnologyMeasurementEducationReal-time Application	2008	22
Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry Young-Min Hwang, Sung-Won Yoon, Jung Hwan Kim, Optics and Lasers in Engineering EngineeringMeasurementCalibrationOptical PropertiesWavelet Transform	2007	20
A Comparative Study on the Three-Dimensional Surface Topography for the Polished Surface of Femoral Head Heui-Jae Pahk, K.J. Stout, Liam Blunt The International Journal of Advanced Manufacturing Technology EngineeringThree-dimensional Surface TopographyBiomechanicsMechanical EngineeringComparative Study	2000	19

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