Heui-Jae Pahk

Thickness and Surface Measurement of Transparent Thin-Film Layers using White Light Scanning Interferometry Combined with Reflectometry

Taeyong Jo, Kwangrak Kim, Seongryong Kim et al. · Journal of the Optical Society of Korea · 2014 · 33 citations · Full text

Optical Materials, Engineering, Microscopy +18

Development of straightness measurement technique using the profile matching method

Heui-Jae Pahk, Joong Shin Park, In‐Sung Yeo · International Journal of Machine Tools and Manufacture · 1997 · 31 citations

Sensor Calibration, Engineering, Measurement +8

Integrated precision inspection system for manufacturing of moulds having CAD defined features

Heui-Jae Pahk, Min-Po Jung, S. W. Hwang et al. · The International Journal of Advanced Manufacturing Technology · 1995 · 31 citations

Geometric Modeling, Industrial Design, Engineering +12

Development of Computer-Aided Inspection System with CMM for Integrated Mold Manufacturing

Heui-Jae Pahk, Y.H. Kim, Yeh-Sun Hong et al. · CIRP Annals · 1993 · 31 citations

Computer-aided Inspection System, Industrial Design, Engineering +12

3D Measurement of TSVs Using Low Numerical Aperture White-Light Scanning Interferometry

Taeyong Jo, Seongryong Kim, Heui-Jae Pahk · Journal of the Optical Society of Korea · 2013 · 27 citations · Full text

Engineering, Measurement, Optical Testing +20