Irving Chyr

Focused ion beam micromilling of GaN and related substrate materials (sapphire, SiC, and Si)

A. J. Steckl, Irving Chyr · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 43 citations

Engineering, Materials Engineering, Materials Science +16

Near 1 kW of Continuous-Wave Power From a Single High-Efficiency Diode-Laser Bar

Hanxuan Li, Terry Towe, Irving Chyr et al. · IEEE Photonics Technology Letters · 2007 · 35 citations

Engineering, Electrical Engineering, Materials Science +16

Damage generation and removal in the Ga+ focused ion beam micromachining of GaN for photonic applications

Irving Chyr, Boon Lee, Liang-Chiun Chao et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 29 citations

Engineering, Materials Engineering, Materials Science +17

GaN focused ion beam micromachining with gas-assisted etching

Irving Chyr, A. J. Steckl · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 26 citations

Engineering, Materials Engineering, Materials Science +15

Upconversion luminescence of Er-implanted GaN films by focused-ion-beam direct write

Liang-Chiun Chao, Boon K. Lee, C. J. et al. · Applied Physics Letters · 1999 · 16 citations

Engineering, Materials Engineering, Materials Science +17