Statistics
Publications
5
Citations
160
H-Index
5
Active since
1993
Affiliations
P.S. Parikh is an author at AT&T (United States) specializing in design for testability, built-in self-test, and fault-tolerant computing.
Publications per year
1993–2005
5
5
Testability-based partial scan analysis
P.S. Parikh, M. Abramovici · Journal of Electronic Testing · 1995 · 47 citations
A cost-based approach to partial scan
P.S. Parikh, M. Abramovici · 1993 · 43 citations
On selecting flip-flops for partial reset
M. Abramovici, P.S. Parikh, B. Mathew et al. · 2002 · 28 citations
Engineering, Computer Engineering, Electrical Engineering +9
WARNING: 100% Fault Coverage May Be Misleading!!
M. Abramovici, P.S. Parikh · 2005 · 25 citations
On combining design for testability techniques
P.S. Parikh, M. Abramovici · 2002 · 17 citations
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