S. D. Kosowsky

Complete wetting of a rough surface: An x-ray study

I. M. Tidswell, T. A. Rabedeau, P. S. Pershan et al. · Physical Review Letters · 1991 · 147 citations

Materials Science, Surface Characterization, Engineering +12

X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers

I. M. Tidswell, T. A. Rabedeau, P. S. Pershan et al. · The Journal of Chemical Physics · 1991 · 138 citations

Materials Science, Surface Characterization, X-ray Spectroscopy +15

Evidence of annealing effects on a high-density Si/SiO2 interfacial layer

S. D. Kosowsky, P. S. Pershan, K.S. Krisch et al. · Applied Physics Letters · 1997 · 83 citations · Full text

Materials Engineering, Materials Science, Epitaxial Growth +14

Liquid-vapor density profile of helium: An x-ray study

Laurence Lurio, T. A. Rabedeau, P. S. Pershan et al. · Physical Review Letters · 1992 · 77 citations

Quantum Liquid, Thin Film Physics, X-ray Spectroscopy +17

X-ray study of pressure-collapsed fullerite

S. D. Kosowsky, Ching‐Hsiang Hsu, Nancy H. Chen et al. · Physical review. B, Condensed matter · 1993 · 18 citations · Full text

X-ray Crystallography, X-ray Spectroscopy, Engineering +16